专利摘要:
Proposed is an injector (1), which is made of silicon and in processes, in particular processes in semiconductor technology, allows the introduction of treatment gas in process chambers. The injector (1) is designed as a tube (2), are provided in the outlet openings for the introduced into the process chamber treatment gas. In the tube (2), which serves as an injector 1, at least one gas flow channel (4) is provided. The profile of the tube serving as an injector (1) is non-circular, that is deviates from a circular profile, with elongated, triangular or star-shaped profile shapes are taken into consideration.
公开号:AT518081A4
申请号:T815/2015
申请日:2015-12-22
公开日:2017-07-15
发明作者:Nadrag Enrico;Nadrag Walter
申请人:Sico Tech Gmbh;
IPC主号:
专利说明:

The invention relates to an injector having the features of the introductory part of patent claim 1.
When manufacturing wafers, the wafers are placed in brackets (boats) and placed in treatment rooms (ovens) where they are treated with a gas.
The treatment gas is introduced into the furnace via an injector, which is normally formed as a bent or angled, perforated tube made of quartz glass.
The problem with the known quartz glass injectors is that deposits due to the treatment process on the quartz glass injector can break off due to thermal stresses (flakings) and can impair the proper production of wafers.
The chipping causes particles which are undesirable in processes in the semiconductor industry.
The invention has for its object to provide an injector available that does not cause the problems described.
This object is achieved according to the invention with an injector having the feature of claim 1.
Preferred and advantageous embodiments of the injector according to the invention are the subject of the claims.
Since the injector according to the invention is designed as a tube made of silicon, there are no thermal stresses that could cause the flaking off of deposits (flakings). Moreover, with the injector according to the invention, the formation of deposits is prevented or at least reduced.
The silicon injector according to the invention is not only a straight tube, but it may also be a bent or angled tube.
In order to provide the silicon injector according to the invention with sufficient mechanical stability for its use in furnaces for treating wafers with treatment gas, even at elevated temperatures, the profile of the injector in one embodiment is other than circular.
For example, the profile of the injector, in particular in cross section, be rectangular, oblong oval, triangular or star-shaped.
The inventive design of the injector with its non-circular, so non-circular profile, it also allows to provide more than one cavity (channel) in the injector for the supply of treatment gas. Two channels have the advantage that alternatively different treatment gases can be supplied. If one of the channels is misplaced, the other channel may be used for supplying treatment gas into the furnace for treating wafers placed in boats.
The term "profile" is understood in the present case to mean the external shape of the tube used according to the invention as an injector.
As used herein, the term "out of round" includes all profiles which are non-circular in cross-section.
Further details and features of the invention will become apparent from the following description of preferred embodiments with reference to the drawings. Show it:
Fig. 1 to 7 in cross-section different profiles of serving as an injector tubes made of silicon.
The injector 1 according to the invention, which is made of silicon, is designed as a tube which can be straight, bent or angled (for example by 85-95 °).
In the embodiment of an injector 1 made of silicon shown in FIG. 1, the tube 2 has a substantially rectangular profile with convexly curved narrow surfaces 3. In the tube 2, a channel 4 is provided with a circular cross-section.
In the embodiment shown in Fig. 2, the profile of the tube 2 forming the injector 1 is rectangular.
In Fig. 3, an embodiment of a serving as an injector 1 tube 2 is shown, in which two channels 4 are provided. The profile of the tube 2 is elongated, wherein the narrow surfaces 3 of the tube, which are curved in a convex manner, pass over rounded portions 5 into the side surfaces 6 of the tube.
Fig. 4 shows a tube 2, which can be used as an injector 1, whose profile is similar to the profile shown in Fig. 3, wherein in the tube 2 a cross-sectionally elongated channel 4 is provided.
5 shows a modification of the embodiment of a pipe 2 shown in FIG. 2, which can be used as an injector 1, in which bulges 7 are provided in the region of the channel 4 in the side surfaces β of the pipe. The profile of the tube 2 shown in Fig. 5 can also be understood as that of a circular tube with two ribs.
Fig. 6 shows an embodiment of a tube 2, which can be used as an injector 1, in which the profile of the tube 2 is an equilateral triangle. As an alternative to an equilateral triangle, the profile of the tube 2 may be an isosceles or any triangle.
Fig. 7 shows an embodiment of a tube 2, which can be used as an injector 1, wherein the tube 2 comprises a base body with a circular cross section, whose outer surface is formed concentrically to the channel 4 in the tube 2. In the embodiment of the embodiment shown, stiffening ribs 8 protrude from the circular base body to the outside, so that a star-shaped profile is present. The number of stiffening ribs 8 does not have to be four, but can also be two (see Fig. 5) or three or more than four.
When using an injector 1 of silicon according to the invention in processes in which treatment gas is introduced into a process chamber, in particular in semiconductor technology in the production of wafers containing chips, there is no longer the problem, unlike known injectors made of quartz glass the emergence of particles (flakings).
In particular, it has also proved to be advantageous that fewer impurities and particle formation occur when using injectors 1 according to the invention.
Another advantage of the injector 1 according to the invention is its prolonged duration of use and, in addition, that the treatment process becomes cleaner.
Due to the outer shape of the profile of the tube 2 used as an injector 1, which is not circular, the stability of the injector 1 is increased.
As already mentioned and shown for example in FIG. 3, if necessary, several, for example two, three or more than three channels 4 for the supply of treatment gas can be provided in the tube 2 used as the injector 1.
Although not shown in the drawings, in the inventively used as injectors 1 tubes 2, the usual for injectors made of quartz glass outlet openings for the treatment gas (process gas) are provided.
In summary, an embodiment of the invention can be described as follows:
Proposed is an injector 1, which is made of silicon and which allows in processes, in particular processes in semiconductor technology, the introduction of treatment gas in process chambers. The injector 1 is designed as a tube 2, are provided in the outlet openings for the introduced into the process chamber treatment gas. In the tube 2, which serves as an injector 1, at least one gas flow channel 4 is provided. The profile of the pipe serving as the injector 1 is non-circular, thus deviates from a circular profile, wherein elongated, triangular or star-shaped profile shapes are taken into consideration.
权利要求:
Claims (13)
[1]
claims:
An injector (1) for supplying treatment gas into a process chamber, comprising a pipe (2) in which outlet openings for the treatment gas are provided, characterized in that the pipe (2) serving as the injector (1) consists of silicon.
[2]
2. An injector according to claim 1, characterized in that in the tube (2) at least one gas flow channel (4) is provided.
[3]
3. An injector according to claim 2, characterized in that in the tube (2) has two gas flow channels (4) which are arranged to extend parallel to each other, are provided.
[4]
4. Injector according to one of claims 1 to 3, characterized in that the profile of the injector (1) serving as pipe (2) is non-circular.
[5]
5. An injector according to claim 4, characterized in that the profile of the injector (1) serving pipe (2) is rectangular.
[6]
6. An injector according to claim 5, characterized in that the narrow sides (3) of the tube (2) are convexly curved.
[7]
7. An injector according to claim 5 or 6, characterized in that the narrow sides (3) of the tube (2) via bends (5) in the side surfaces (6) of the tube (2) pass.
[8]
8. Injector according to one of claims 1 to 4, characterized in that the injector (1) serving pipe (2) has a base body having a concentric with the channel (4) in the tube (2) curved profile, and that of Round body at least two ribs (8) protrude.
[9]
9. An injector according to claim 8, characterized in that the ribs (8) are provided diametrically opposite one another.
[10]
10. An injector according to claim 8 or 9, characterized in that exactly two ribs (8) are provided.
[11]
11. An injector according to claim 8 or 9, characterized in that three, four or more than four ribs (8) are provided.
[12]
12. Injector according to one of claims 1 to 4, characterized in that the injector (1) serving pipe (2) has a triangular profile.
[13]
13. Injector according to one of claims 2 to 12, characterized in that the gas flow channel (4) has an elongated cross-sectional shape.
类似技术:
公开号 | 公开日 | 专利标题
AT518081B1|2017-07-15|Injector made of silicon for the semiconductor industry
AT520629B1|2019-06-15|Injector made of silicon for the semiconductor industry
DE102014104224A1|2015-10-01|exhaust system
DE10314507A1|2004-10-14|Sheet metal part, especially muffle for cooking equipment
DE2116328A1|1971-10-14|Plant for the production of table gals
DE102009019456A1|2010-11-11|Apparatus for preheating glass shards
DE809979C|1951-08-06|Pipe butt connection with fixed collars, especially for the production of blow-off pipelines
DE2413250A1|1975-10-02|Heat exchanger for e.g. recuperative oven - contains wire mesh inserts in tubes carrying heating gas to promote turbulence
DE491291C|1930-02-07|Chamber furnace with vertical heating trains and slide stones arranged on the feed openings for air or heating gas and air
DE102019007768A1|2021-05-12|Nozzle means, use and method of manufacture
DE854242C|1952-11-04|Upright chamber furnace built from shaped stones with a horizontal cross section
DE420869C|1925-11-03|oven
AT160892B|1943-03-29|Vaulted ceiling made of magnesite bricks, special magnesite bricks or chromite magnesite bricks for industrial furnaces
DE102019212117A1|2020-03-05|Gas discharge system
AT248060B|1966-07-11|Bunsen burner
DE414013C|1925-05-20|Angled water tube boiler with tubes arranged side by side in vertical rows offset from one another
AT107916B|1927-11-10|Discharge device for shaft furnaces, especially for lime.
DE613954C|1935-05-29|Stud connection, especially for locomotive boilers
DE814456C|1951-09-24|Method and furnace for annealing wire and metal strips, e.g. B. band iron
DE472139C|1929-02-22|Cupola furnace with a slag separator connected between the forehearth or iron collector and the shaft
DE754617C|1951-07-26|Device for the even distribution of a gas flow on a treatment room with a wider cross-section than the gas supply line
DE398853C|1924-07-24|A water tube boiler with a gas-tight tube wall consisting of at least one upper and lower boiler and a bundle of tubes connecting them
DE451281C|1927-10-24|Hurricane lantern
DE546218C|1932-03-11|Undivided surface condenser with straight cooling water pipes
CH85328A|1920-06-16|Process and chimney attachment to prevent the obstructive influence of lateral wind on the smoke outlet from chimneys.
同族专利:
公开号 | 公开日
JP2019503086A|2019-01-31|
DE212016000248U1|2018-07-31|
EP3394317A1|2018-10-31|
US20190055652A1|2019-02-21|
KR20180095073A|2018-08-24|
AT518081B1|2017-07-15|
WO2017108714A1|2017-06-29|
引用文献:
公开号 | 申请日 | 公开日 | 申请人 | 专利标题
EP0582444A1|1992-07-31|1994-02-09|Cvd Incorporated|Ultra pure silicon carbide and high temperature semiconductor processing equipment made therefrom|
US5943471A|1996-03-27|1999-08-24|Micron Technology, Inc.|Solid precursor injector apparatus and method|
US20060185589A1|2005-02-23|2006-08-24|Raanan Zehavi|Silicon gas injector and method of making|
US20080286981A1|2007-05-14|2008-11-20|Asm International N.V.|In situ silicon and titanium nitride deposition|
DE3913132A1|1989-04-21|1990-12-20|Hoechst Ag|METHOD FOR THE SIMILAR INTRODUCTION OF A FLUID AND DEVICE FOR CARRYING OUT THE METHOD|
WO2005015619A1|2003-08-07|2005-02-17|Hitachi Kokusai Electric Inc.|Substrate processing apparatus and method for manufacturing semiconductor device|
FR2882064B1|2005-02-17|2007-05-11|Snecma Propulsion Solide Sa|PROCESS FOR THE DENSIFICATION OF THIN POROUS SUBSTRATES BY CHEMICAL VAPOR PHASE INFILTRATION AND DEVICE FOR LOADING SUCH SUBSTRATES|
US7632354B2|2006-08-08|2009-12-15|Tokyo Electron Limited|Thermal processing system with improved process gas flow and method for injecting a process gas into a thermal processing system|
CN102027156A|2008-03-26|2011-04-20|Gt太阳能公司|Systems and methods for distributing gas in a chemical vapor deposition reactor|
WO2010098319A1|2009-02-27|2010-09-02|株式会社トクヤマ|Polycrystalline silicon rod and device for producing same|
US8409352B2|2010-03-01|2013-04-02|Hitachi Kokusai Electric Inc.|Method of manufacturing semiconductor device, method of manufacturing substrate and substrate processing apparatus|
KR101313262B1|2010-07-12|2013-09-30|삼성전자주식회사|Chemical Vapor Deposition Apparatus and Method of Forming Semiconductor Thin Film Using The Same|
US10174422B2|2012-10-25|2019-01-08|Applied Materials, Inc.|Apparatus for selective gas injection and extraction|US10378106B2|2008-11-14|2019-08-13|Asm Ip Holding B.V.|Method of forming insulation film by modified PEALD|
US9394608B2|2009-04-06|2016-07-19|Asm America, Inc.|Semiconductor processing reactor and components thereof|
US8802201B2|2009-08-14|2014-08-12|Asm America, Inc.|Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species|
US9312155B2|2011-06-06|2016-04-12|Asm Japan K.K.|High-throughput semiconductor-processing apparatus equipped with multiple dual-chamber modules|
US10364496B2|2011-06-27|2019-07-30|Asm Ip Holding B.V.|Dual section module having shared and unshared mass flow controllers|
US10854498B2|2011-07-15|2020-12-01|Asm Ip Holding B.V.|Wafer-supporting device and method for producing same|
US9017481B1|2011-10-28|2015-04-28|Asm America, Inc.|Process feed management for semiconductor substrate processing|
US9659799B2|2012-08-28|2017-05-23|Asm Ip Holding B.V.|Systems and methods for dynamic semiconductor process scheduling|
US10714315B2|2012-10-12|2020-07-14|Asm Ip Holdings B.V.|Semiconductor reaction chamber showerhead|
US9484191B2|2013-03-08|2016-11-01|Asm Ip Holding B.V.|Pulsed remote plasma method and system|
US9589770B2|2013-03-08|2017-03-07|Asm Ip Holding B.V.|Method and systems for in-situ formation of intermediate reactive species|
US9240412B2|2013-09-27|2016-01-19|Asm Ip Holding B.V.|Semiconductor structure and device and methods of forming same using selective epitaxial process|
US10683571B2|2014-02-25|2020-06-16|Asm Ip Holding B.V.|Gas supply manifold and method of supplying gases to chamber using same|
US10167557B2|2014-03-18|2019-01-01|Asm Ip Holding B.V.|Gas distribution system, reactor including the system, and methods of using the same|
US11015245B2|2014-03-19|2021-05-25|Asm Ip Holding B.V.|Gas-phase reactor and system having exhaust plenum and components thereof|
US10858737B2|2014-07-28|2020-12-08|Asm Ip Holding B.V.|Showerhead assembly and components thereof|
US9890456B2|2014-08-21|2018-02-13|Asm Ip Holding B.V.|Method and system for in situ formation of gas-phase compounds|
US9657845B2|2014-10-07|2017-05-23|Asm Ip Holding B.V.|Variable conductance gas distribution apparatus and method|
US10941490B2|2014-10-07|2021-03-09|Asm Ip Holding B.V.|Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same|
KR102263121B1|2014-12-22|2021-06-09|에이에스엠 아이피 홀딩 비.브이.|Semiconductor device and manufacuring method thereof|
US10529542B2|2015-03-11|2020-01-07|Asm Ip Holdings B.V.|Cross-flow reactor and method|
US10276355B2|2015-03-12|2019-04-30|Asm Ip Holding B.V.|Multi-zone reactor, system including the reactor, and method of using the same|
US10458018B2|2015-06-26|2019-10-29|Asm Ip Holding B.V.|Structures including metal carbide material, devices including the structures, and methods of forming same|
US10600673B2|2015-07-07|2020-03-24|Asm Ip Holding B.V.|Magnetic susceptor to baseplate seal|
US9960072B2|2015-09-29|2018-05-01|Asm Ip Holding B.V.|Variable adjustment for precise matching of multiple chamber cavity housings|
US10211308B2|2015-10-21|2019-02-19|Asm Ip Holding B.V.|NbMC layers|
US10322384B2|2015-11-09|2019-06-18|Asm Ip Holding B.V.|Counter flow mixer for process chamber|
US11139308B2|2015-12-29|2021-10-05|Asm Ip Holding B.V.|Atomic layer deposition of III-V compounds to form V-NAND devices|
US10529554B2|2016-02-19|2020-01-07|Asm Ip Holding B.V.|Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches|
US10468251B2|2016-02-19|2019-11-05|Asm Ip Holding B.V.|Method for forming spacers using silicon nitride film for spacer-defined multiple patterning|
US10501866B2|2016-03-09|2019-12-10|Asm Ip Holding B.V.|Gas distribution apparatus for improved film uniformity in an epitaxial system|
US10343920B2|2016-03-18|2019-07-09|Asm Ip Holding B.V.|Aligned carbon nanotubes|
US9892913B2|2016-03-24|2018-02-13|Asm Ip Holding B.V.|Radial and thickness control via biased multi-port injection settings|
US10190213B2|2016-04-21|2019-01-29|Asm Ip Holding B.V.|Deposition of metal borides|
US10865475B2|2016-04-21|2020-12-15|Asm Ip Holding B.V.|Deposition of metal borides and silicides|
US10032628B2|2016-05-02|2018-07-24|Asm Ip Holding B.V.|Source/drain performance through conformal solid state doping|
US10367080B2|2016-05-02|2019-07-30|Asm Ip Holding B.V.|Method of forming a germanium oxynitride film|
KR20170129475A|2016-05-17|2017-11-27|에이에스엠 아이피 홀딩 비.브이.|Method of forming metal interconnection and method of fabricating semiconductor device using the same|
US10388509B2|2016-06-28|2019-08-20|Asm Ip Holding B.V.|Formation of epitaxial layers via dislocation filtering|
US10612137B2|2016-07-08|2020-04-07|Asm Ip Holdings B.V.|Organic reactants for atomic layer deposition|
US9859151B1|2016-07-08|2018-01-02|Asm Ip Holding B.V.|Selective film deposition method to form air gaps|
US10714385B2|2016-07-19|2020-07-14|Asm Ip Holding B.V.|Selective deposition of tungsten|
US10381226B2|2016-07-27|2019-08-13|Asm Ip Holding B.V.|Method of processing substrate|
KR20180013034A|2016-07-28|2018-02-07|에이에스엠 아이피 홀딩 비.브이.|Substrate processing apparatus and method of operating the same|
US10395919B2|2016-07-28|2019-08-27|Asm Ip Holding B.V.|Method and apparatus for filling a gap|
US9887082B1|2016-07-28|2018-02-06|Asm Ip Holding B.V.|Method and apparatus for filling a gap|
US10410943B2|2016-10-13|2019-09-10|Asm Ip Holding B.V.|Method for passivating a surface of a semiconductor and related systems|
US10643826B2|2016-10-26|2020-05-05|Asm Ip Holdings B.V.|Methods for thermally calibrating reaction chambers|
US10229833B2|2016-11-01|2019-03-12|Asm Ip Holding B.V.|Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures|
US10643904B2|2016-11-01|2020-05-05|Asm Ip Holdings B.V.|Methods for forming a semiconductor device and related semiconductor device structures|
US10714350B2|2016-11-01|2020-07-14|ASM IP Holdings, B.V.|Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures|
US10435790B2|2016-11-01|2019-10-08|Asm Ip Holding B.V.|Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap|
US10134757B2|2016-11-07|2018-11-20|Asm Ip Holding B.V.|Method of processing a substrate and a device manufactured by using the method|
KR20180054366A|2016-11-15|2018-05-24|에이에스엠 아이피 홀딩 비.브이.|Gas supply unit and substrate processing apparatus including the same|
US10340135B2|2016-11-28|2019-07-02|Asm Ip Holding B.V.|Method of topologically restricted plasma-enhanced cyclic deposition of silicon or metal nitride|
KR20180068582A|2016-12-14|2018-06-22|에이에스엠 아이피 홀딩 비.브이.|Substrate processing apparatus|
KR20180070971A|2016-12-19|2018-06-27|에이에스엠 아이피 홀딩 비.브이.|Substrate processing apparatus|
US10269558B2|2016-12-22|2019-04-23|Asm Ip Holding B.V.|Method of forming a structure on a substrate|
US10867788B2|2016-12-28|2020-12-15|Asm Ip Holding B.V.|Method of forming a structure on a substrate|
US10655221B2|2017-02-09|2020-05-19|Asm Ip Holding B.V.|Method for depositing oxide film by thermal ALD and PEALD|
US10468261B2|2017-02-15|2019-11-05|Asm Ip Holding B.V.|Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures|
US10529563B2|2017-03-29|2020-01-07|Asm Ip Holdings B.V.|Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures|
US10283353B2|2017-03-29|2019-05-07|Asm Ip Holding B.V.|Method of reforming insulating film deposited on substrate with recess pattern|
US10103040B1|2017-03-31|2018-10-16|Asm Ip Holding B.V.|Apparatus and method for manufacturing a semiconductor device|
KR20180119477A|2017-04-25|2018-11-02|에이에스엠 아이피 홀딩 비.브이.|Method for depositing a thin film and manufacturing a semiconductor device|
US10446393B2|2017-05-08|2019-10-15|Asm Ip Holding B.V.|Methods for forming silicon-containing epitaxial layers and related semiconductor device structures|
US10770286B2|2017-05-08|2020-09-08|Asm Ip Holdings B.V.|Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures|
US10892156B2|2017-05-08|2021-01-12|Asm Ip Holding B.V.|Methods for forming a silicon nitride film on a substrate and related semiconductor device structures|
US10504742B2|2017-05-31|2019-12-10|Asm Ip Holding B.V.|Method of atomic layer etching using hydrogen plasma|
US10886123B2|2017-06-02|2021-01-05|Asm Ip Holding B.V.|Methods for forming low temperature semiconductor layers and related semiconductor device structures|
US10685834B2|2017-07-05|2020-06-16|Asm Ip Holdings B.V.|Methods for forming a silicon germanium tin layer and related semiconductor device structures|
KR20190009245A|2017-07-18|2019-01-28|에이에스엠 아이피 홀딩 비.브이.|Methods for forming a semiconductor device structure and related semiconductor device structures|
US10541333B2|2017-07-19|2020-01-21|Asm Ip Holding B.V.|Method for depositing a group IV semiconductor and related semiconductor device structures|
US11018002B2|2017-07-19|2021-05-25|Asm Ip Holding B.V.|Method for selectively depositing a Group IV semiconductor and related semiconductor device structures|
US10312055B2|2017-07-26|2019-06-04|Asm Ip Holding B.V.|Method of depositing film by PEALD using negative bias|
US10590535B2|2017-07-26|2020-03-17|Asm Ip Holdings B.V.|Chemical treatment, deposition and/or infiltration apparatus and method for using the same|
US10605530B2|2017-07-26|2020-03-31|Asm Ip Holding B.V.|Assembly of a liner and a flange for a vertical furnace as well as the liner and the vertical furnace|
US10692741B2|2017-08-08|2020-06-23|Asm Ip Holdings B.V.|Radiation shield|
US10770336B2|2017-08-08|2020-09-08|Asm Ip Holding B.V.|Substrate lift mechanism and reactor including same|
US11139191B2|2017-08-09|2021-10-05|Asm Ip Holding B.V.|Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith|
US10249524B2|2017-08-09|2019-04-02|Asm Ip Holding B.V.|Cassette holder assembly for a substrate cassette and holding member for use in such assembly|
USD881373S1|2017-08-18|2020-04-14|Steven S. Wagner|Exhaust fan screen|
USD900036S1|2017-08-24|2020-10-27|Asm Ip Holding B.V.|Heater electrical connector and adapter|
US11056344B2|2017-08-30|2021-07-06|Asm Ip Holding B.V.|Layer forming method|
KR20190023920A|2017-08-30|2019-03-08|에이에스엠 아이피 홀딩 비.브이.|Substrate processing apparatus|
US10607895B2|2017-09-18|2020-03-31|Asm Ip Holdings B.V.|Method for forming a semiconductor device structure comprising a gate fill metal|
KR20190033455A|2017-09-21|2019-03-29|에이에스엠 아이피 홀딩 비.브이.|Method of sequential infiltration synthesis treatment of infiltrateable material and structures and devices formed using same|
US10844484B2|2017-09-22|2020-11-24|Asm Ip Holding B.V.|Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods|
US10658205B2|2017-09-28|2020-05-19|Asm Ip Holdings B.V.|Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber|
US10403504B2|2017-10-05|2019-09-03|Asm Ip Holding B.V.|Method for selectively depositing a metallic film on a substrate|
US10319588B2|2017-10-10|2019-06-11|Asm Ip Holding B.V.|Method for depositing a metal chalcogenide on a substrate by cyclical deposition|
US10923344B2|2017-10-30|2021-02-16|Asm Ip Holding B.V.|Methods for forming a semiconductor structure and related semiconductor structures|
KR20190056158A|2017-11-16|2019-05-24|에이에스엠 아이피 홀딩 비.브이.|Method of processing a substrate and a device manufactured by the same|
US10910262B2|2017-11-16|2021-02-02|Asm Ip Holding B.V.|Method of selectively depositing a capping layer structure on a semiconductor device structure|
US11022879B2|2017-11-24|2021-06-01|Asm Ip Holding B.V.|Method of forming an enhanced unexposed photoresist layer|
KR20200089659A|2017-11-27|2020-07-27|에이에스엠 아이피 홀딩 비.브이.|Storage device for storing wafer cassettes for use with batch furnaces|
US10290508B1|2017-12-05|2019-05-14|Asm Ip Holding B.V.|Method for forming vertical spacers for spacer-defined patterning|
US10872771B2|2018-01-16|2020-12-22|Asm Ip Holding B. V.|Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures|
USD903477S1|2018-01-24|2020-12-01|Asm Ip Holdings B.V.|Metal clamp|
US11018047B2|2018-01-25|2021-05-25|Asm Ip Holding B.V.|Hybrid lift pin|
USD880437S1|2018-02-01|2020-04-07|Asm Ip Holding B.V.|Gas supply plate for semiconductor manufacturing apparatus|
US10535516B2|2018-02-01|2020-01-14|Asm Ip Holdings B.V.|Method for depositing a semiconductor structure on a surface of a substrate and related semiconductor structures|
US11081345B2|2018-02-06|2021-08-03|Asm Ip Holding B.V.|Method of post-deposition treatment for silicon oxide film|
US10896820B2|2018-02-14|2021-01-19|Asm Ip Holding B.V.|Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process|
US10731249B2|2018-02-15|2020-08-04|Asm Ip Holding B.V.|Method of forming a transition metal containing film on a substrate by a cyclical deposition process, a method for supplying a transition metal halide compound to a reaction chamber, and related vapor deposition apparatus|
US10658181B2|2018-02-20|2020-05-19|Asm Ip Holding B.V.|Method of spacer-defined direct patterning in semiconductor fabrication|
US10975470B2|2018-02-23|2021-04-13|Asm Ip Holding B.V.|Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment|
US11114283B2|2018-03-16|2021-09-07|Asm Ip Holding B.V.|Reactor, system including the reactor, and methods of manufacturing and using same|
KR20190113580A|2018-03-27|2019-10-08|에이에스엠 아이피 홀딩 비.브이.|Method of forming an electrode on a substrate and a semiconductor device structure including an electrode|
US11088002B2|2018-03-29|2021-08-10|Asm Ip Holding B.V.|Substrate rack and a substrate processing system and method|
US10510536B2|2018-03-29|2019-12-17|Asm Ip Holding B.V.|Method of depositing a co-doped polysilicon film on a surface of a substrate within a reaction chamber|
US11230766B2|2018-03-29|2022-01-25|Asm Ip Holding B.V.|Substrate processing apparatus and method|
KR20190114682A|2018-03-30|2019-10-10|에이에스엠 아이피 홀딩 비.브이.|Substrate processing method|
KR20190129718A|2018-05-11|2019-11-20|에이에스엠 아이피 홀딩 비.브이.|Methods for forming a doped metal carbide film on a substrate and related semiconductor device structures|
AT520629B1|2018-05-22|2019-06-15|Sico Tech Gmbh|Injector made of silicon for the semiconductor industry|
TW202013553A|2018-06-04|2020-04-01|荷蘭商Asm 智慧財產控股公司|Wafer handling chamber with moisture reduction|
US10797133B2|2018-06-21|2020-10-06|Asm Ip Holding B.V.|Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures|
US10612136B2|2018-06-29|2020-04-07|ASM IP Holding, B.V.|Temperature-controlled flange and reactor system including same|
KR20200002519A|2018-06-29|2020-01-08|에이에스엠 아이피 홀딩 비.브이.|Method for depositing a thin film and manufacturing a semiconductor device|
US10388513B1|2018-07-03|2019-08-20|Asm Ip Holding B.V.|Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition|
US10755922B2|2018-07-03|2020-08-25|Asm Ip Holding B.V.|Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition|
US10767789B2|2018-07-16|2020-09-08|Asm Ip Holding B.V.|Diaphragm valves, valve components, and methods for forming valve components|
US10483099B1|2018-07-26|2019-11-19|Asm Ip Holding B.V.|Method for forming thermally stable organosilicon polymer film|
US11053591B2|2018-08-06|2021-07-06|Asm Ip Holding B.V.|Multi-port gas injection system and reactor system including same|
US10883175B2|2018-08-09|2021-01-05|Asm Ip Holding B.V.|Vertical furnace for processing substrates and a liner for use therein|
US10829852B2|2018-08-16|2020-11-10|Asm Ip Holding B.V.|Gas distribution device for a wafer processing apparatus|
US11024523B2|2018-09-11|2021-06-01|Asm Ip Holding B.V.|Substrate processing apparatus and method|
US11049751B2|2018-09-14|2021-06-29|Asm Ip Holding B.V.|Cassette supply system to store and handle cassettes and processing apparatus equipped therewith|
US11232963B2|2018-10-03|2022-01-25|Asm Ip Holding B.V.|Substrate processing apparatus and method|
US10847365B2|2018-10-11|2020-11-24|Asm Ip Holding B.V.|Method of forming conformal silicon carbide film by cyclic CVD|
US10811256B2|2018-10-16|2020-10-20|Asm Ip Holding B.V.|Method for etching a carbon-containing feature|
KR20200045067A|2018-10-19|2020-05-04|에이에스엠 아이피 홀딩 비.브이.|Substrate processing apparatus and substrate processing method|
US10381219B1|2018-10-25|2019-08-13|Asm Ip Holding B.V.|Methods for forming a silicon nitride film|
US11087997B2|2018-10-31|2021-08-10|Asm Ip Holding B.V.|Substrate processing apparatus for processing substrates|
US11031242B2|2018-11-07|2021-06-08|Asm Ip Holding B.V.|Methods for depositing a boron doped silicon germanium film|
US10847366B2|2018-11-16|2020-11-24|Asm Ip Holding B.V.|Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process|
US10818758B2|2018-11-16|2020-10-27|Asm Ip Holding B.V.|Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures|
US10559458B1|2018-11-26|2020-02-11|Asm Ip Holding B.V.|Method of forming oxynitride film|
US11217444B2|2018-11-30|2022-01-04|Asm Ip Holding B.V.|Method for forming an ultraviolet radiation responsive metal oxide-containing film|
US11158513B2|2018-12-13|2021-10-26|Asm Ip Holding B.V.|Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures|
KR20200091543A|2019-01-22|2020-07-31|에이에스엠 아이피 홀딩 비.브이.|Semiconductor processing device|
CN111524788A|2019-02-01|2020-08-11|Asm Ip私人控股有限公司|Method for topologically selective film formation of silicon oxide|
TW202044325A|2019-02-20|2020-12-01|荷蘭商Asm Ip私人控股有限公司|Method of filling a recess formed within a surface of a substrate, semiconductor structure formed according to the method, and semiconductor processing apparatus|
KR20200102352A|2019-02-20|2020-08-31|에이에스엠 아이피 홀딩 비.브이.|Cyclical deposition method including treatment step and apparatus for same|
KR20200108243A|2019-03-08|2020-09-17|에이에스엠 아이피 홀딩 비.브이.|Structure Including SiOC Layer and Method of Forming Same|
USD935572S1|2019-05-24|2021-11-09|Asm Ip Holding B.V.|Gas channel plate|
USD922229S1|2019-06-05|2021-06-15|Asm Ip Holding B.V.|Device for controlling a temperature of a gas supply unit|
USD944946S1|2019-06-14|2022-03-01|Asm Ip Holding B.V.|Shower plate|
USD931978S1|2019-06-27|2021-09-28|Asm Ip Holding B.V.|Showerhead vacuum transport|
US11227782B2|2019-07-31|2022-01-18|Asm Ip Holding B.V.|Vertical batch furnace assembly|
USD930782S1|2019-08-22|2021-09-14|Asm Ip Holding B.V.|Gas distributor|
USD940837S1|2019-08-22|2022-01-11|Asm Ip Holding B.V.|Electrode|
法律状态:
优先权:
申请号 | 申请日 | 专利标题
ATA815/2015A|AT518081B1|2015-12-22|2015-12-22|Injector made of silicon for the semiconductor industry|ATA815/2015A| AT518081B1|2015-12-22|2015-12-22|Injector made of silicon for the semiconductor industry|
DE212016000248.1U| DE212016000248U1|2015-12-22|2016-12-19|Injector made of silicon for the semiconductor industry|
JP2018552122A| JP2019503086A|2015-12-22|2016-12-19|Silicon injector for the semiconductor industry|
US16/065,227| US20190055652A1|2015-12-22|2016-12-19|Injector of silicon for the semiconductor industry|
PCT/EP2016/081788| WO2017108714A1|2015-12-22|2016-12-19|Injector of silicon for the semiconductor industry|
KR1020187020897A| KR20180095073A|2015-12-22|2016-12-19|Silicon injector for the semiconductor industry|
EP16816680.9A| EP3394317A1|2015-12-22|2016-12-19|Injector of silicon for the semiconductor industry|
[返回顶部]